WP 1.1.5 – Analog, RF, and SPIC Testing On a Low-Speed Tester

This project will address the production test needs of a silicon-based high-speed photonic transceiver solution for metro-reach terabit optical modems. For this project, the partnership will be between Ciena, DA Integrated (test development contractor) and Prof. Gordon W. Roberts from McGill University (academic expert in DFT and mixed-signal design and test). The scope of this collaborative research will be to devise low-cost test techniques and DFT circuits beyond the current state-of-the art that will potentially be used in production testing, characterization, and calibration of Cienaâs next generation optical transceiver chips (>100 Gbps). Of particular interest is the need for the analog/mixed-signal/RF circuits to be tested on a digital test platform. TO BE CONT’D

Faculty Supervisor:

Gordon Roberts

Student:

Ahmed Emara;Denis Romanov

Partner:

Ciena Corp.

Discipline:

Engineering - computer / electrical

Sector:

Information and cultural industries

University:

Program: